Matthias Alfeld is since November 2018 Assistant Professor at the TU Delft for "X-rays in Art and Archaeology". He did his PhD at the Universities of Hamburg and Antwerp and joined the TU Delft after PostDocs at the DESY synchrotron and the Sorbonne Universities. The three pillars of his research are: the development of novel instruments, including contributions to the inverse Compton Source Smart*Light; the development of novel and dedicated data evaluation workflows and the application of both to cultural heritage objects with an art or archaeology background.
Job titleAssistant Professor, Faculty 3ME, TU Delft
Phone number+31 15 27 88253